Electron Microscope Specimen Mounts and Holders
Ted Pella Inc PELCO X-TREME SEM Storage Box and holder for up to 18 of the 12.7mm SEM pin mounts
Very strong and rugged clear polycarbonate box to store standard pin mounts with 3.2mm (1/8"). This box is watertight, crushproof and dustproof. The strong hinges, locking clasps and soft silicone O-ring seal makes this an ideal transport, shipping and storage box for SEM samples on pin mounts. The holder insert is numbered 1-18 and accommodates all types of pin mounts form 6.4 to 50mm diameter.
Ted Pella Inc 45º SEM Mount, 10/pack
45º SEM Mount Ø12.7mm for FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs. Aluminum, grooved edge, 7.8mm pin height.
Electron Microscopy Sciences Grid Boxes for use in routine grid handling and long term storage. Capable of storing 3.05 mm or 2.3 mm diameter grids, 25 column card.
Our grid boxes are for use in routine grid handling and long term storage. Each diamond will hold Stores 3.05 mm or 2.3 mm diameter grids. The two side features allow easier handling during specimen removal. Grid can be catalogued using the alpha numeric index on the side and the durable 25 column card for record keeping. EMS25 is a small grid storage box, designed as a low alternative to larger grid boxes.
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 2" surface, 1/4" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 2"
Height: 1/4"
Electron Microscopy Sciences Multi Holder for 29 pin stubs, 3.2 mm x 8mm Pin
This 90 mm in diameter multi pin holder is designed to save time. It is made from machined aluminum with 302 stainless steel springs that hold the pin stubs in place. It accommodates up to twenty nine standard 12.7 mm (1/2") pin stubs
Type: 3.2 mm x 8mm Pin
Cytiva Centrassette P holder including torque wrench and socket
Centrassette P holder including torque wrench and socket
Electron Microscopy Sciences Calibration Specimen 300-2D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: Choose a mount
Grainger Machine Vise 2 Fixed
The Dayton Machine Vise has a 2 inch jaw face and a maximum jaw opening of 2 inches. It is made of ductile iron with a hardened steel vise screw and replaceable steel jaw plates. The vise has a flat base that allows it to be permanently mounted. The vise can handle up to 550 lbs of clamping force. This medium duty machine vise is suitable for precision workholding applications.
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 5/8" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"